High-efficiency, thin-film InP solar cells grown heteroepitaxially on GaAs and Si single-crystal bulk substrates are being developed as a means of eliminating the problems associated with using single-crystal InP substrates. A novel device structure employing a compositionally graded Ga(x)In(1-x)As layer between the bulk substrate and the InP cell layers is used to reduce the dislocation density and improve the minority carrier properties in the InP. The structures are grown in a continuous sequence of steps using computer-controlled atmospheric pressure metalorganic vapor phase epitaxy (APMOVPE). Dislocation densities as low as 3 x 10(exp 7) sq cm and minority carrier lifetimes as high as 3.3 ns are achieved in the InP layers with this method using both GaAs or Si substrates. Structures prepared in this fashion are also completely free of microcracks. These results represent a substantial improvement in InP layer quality when compared to heteroepitaxial InP prepared using conventional techniques such as thermally cycled growth and post-growth annealing. The present work is is concerned with the fabrication and characterization of high-efficiency, thin-film InP solar cells. Both one-sun and concentrator cells were prepared for device structures grown on GaAs substrates. One-cell cells have efficiencies as high as 13.7 percent at 25 C. However, results for the concentrator cells are emphasized. The concentrator cell performance is characterized as a function of the air mass zero (AM0) solar concentration ratio and operating temperature. From these data, the temperature coefficients of the cell performance parameters are derived as a function of the concentration ratio. Under concentration, the cells exhibit a dramatic increase in efficiency and an improved temperature coefficient of efficiency. At 25 C, a peak conversion efficiency of 18.9 percent is reported. At 80 C, the peak AM0 efficiency is 15.7 percent at 75.6 suns. These are the highest efficiencies yet reported for InP heteroepitaxial cells. Approaches for further improving the cell performance are discussed.
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机译:作为消除与使用单晶InP衬底相关的问题的一种手段,正在开发在GaAs和Si单晶大块衬底上异质外延生长的高效薄膜InP太阳能电池。一种新颖的器件结构在体衬底和InP单元层之间采用了成分渐变的Ga(x)In(1-x)As层,用于降低位错密度并改善InP中的少数载流子性能。使用计算机控制的大气压金属有机气相外延(APMOVPE),以连续的步骤顺序生长结构。使用GaAs或Si衬底的这种方法在InP层中实现的位错密度低至3 x 10(exp 7)sq cm,少数载流子寿命高达3.3 ns。以这种方式制备的结构也完全没有微裂纹。与使用常规技术(例如热循环生长和生长后退火)制备的异质外延InP相比,这些结果表示InP层质量有了实质性的改善。本工作涉及高效薄膜InP太阳能电池的制造和表征。为在GaAs衬底上生长的器件结构准备了单光电池和集中器电池。单电池在25°C时的效率高达13.7%。但是,强调了浓缩器电池的结果。集中器电池性能的特征在于零空气质量(AM0)太阳集中度和工作温度。从这些数据中,得出电池性能参数的温度系数作为浓度比的函数。在浓缩下,细胞显示出效率的极大提高和效率温度系数的改善。据报道,在25°C时的峰值转换效率为18.9%。在80 C时,在75.6日晒时,AM0的峰值效率为15.7%。这些是InP异质外延电池迄今报道的最高效率。讨论了进一步改善电池性能的方法。
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